期刊文献+
任意字段
题名或关键词
题名
关键词
文摘
作者
第一作者
机构
刊名
分类号
参考文献
作者简介
基金资助
栏目信息

Simulation of cross-correlation method for temporal characterization of VUV free-electron-lasers

Simulation of cross-correlation method for temporal characterization of VUV free-electron-lasers
原文传递
导出
摘要 The cross-correlation method for temporal characterization is investigated using simulations of the two- color above threshold ionization （ATI） on He induced by a vacuum ultraviolet （VUV） free-electron laser （FEL） in the presence of an infrared （IR） field. Non-linear dependencies of the sideband structure pro- duced in the two-color ATI process are expressed as a function of IR laser intensity by considering the spatial distributions and temporal jitter of both lasers. The temporal properties of the FEL pulse can be characterized accurately using the cross-correlation method at a low IR laser intensity of ~3~101~ W/cm2 but with low cross-correlation signals. When the dynamic range of sidebands is increased to high IR intensity, the accuracy of the cross-correlation method becomes crucially dependent on the actual non- linear index. An approach of determining this index is proposed here to improve the accuracy of temporal characterizations. The cross-correlation method for temporal characterization is investigated using simulations of the two- color above threshold ionization （ATI） on He induced by a vacuum ultraviolet （VUV） free-electron laser （FEL） in the presence of an infrared （IR） field. Non-linear dependencies of the sideband structure pro- duced in the two-color ATI process are expressed as a function of IR laser intensity by considering the spatial distributions and temporal jitter of both lasers. The temporal properties of the FEL pulse can be characterized accurately using the cross-correlation method at a low IR laser intensity of ~3~101~ W/cm2 but with low cross-correlation signals. When the dynamic range of sidebands is increased to high IR intensity, the accuracy of the cross-correlation method becomes crucially dependent on the actual non- linear index. An approach of determining this index is proposed here to improve the accuracy of temporal characterizations.
作者 李文斌 马晓颖 杨晓月 王占山
机构地区 MOE Key Laboratory of Advanced Micro-structure Materials
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2013年第9期55-59,共5页 中国光学快报（英文版）
基金 supported by the National Natural Science Foundation of China(No.11075118) the Specialized Research Fund for the Doctoral Program of Higher Education(No.20100072120036)
关键词 Free electron lasers Free electron lasers
分类号 TN248.6 [电子电信—物理电子学] TN248.1 [电子电信—物理电子学]
  • 相关文献

参考文献20

  • 1W. Ackermann, G. Asova, V. Ayvazyan, A. Azima, N. Baboi, J. Bohr, V. Balandin, B. Beutner, A. Brandt, A. Bolzmann, R. Brinkmann, O. I. Brovko, M. Castel- lano, P. Castro, L. Catani, E. Chiadroni, S. Choroba, A. Cianchi, J. T. Costello, D. Cubaynes, J. Dardis, W. Decking, H. Delsim-Hashemi, A. Delserieys, G. Di Pirro, M. Dohlus, S. Dfisterer, A. Eckhardt, H. T. Edwards, B. Faatz, J. Feldhaus, K. Foumann, J. Frisch, L. Frohlich, T. Garvey, U. Gensch, Ch. Gerth, M. GSrler, N. Gol- ubeva, H.-J. Grabosch, M. Grecki, O. Grimm, K. Hacker, U. Hahn, J. H. Han, K. Honkavaara, T. Hott, M. Hfining, Y. Ivanisenko, E. Jaeschke, W. Jalmuzna, T. Jezynski, R. Kammering, V. Katalev, K. Kavanagh, E. T. Kennedy, S. Khodyachykh, K. Klose, V. Kocharyan, M. KSrfer, M. Kollewe, W. Koprek, S. Korepanov, D. Kostin, M. Krassilnikov, G. Kube, M. Kuhlmann, C. L. S. Lewis, L. Lilje, T. Limberg, D. Lipka, F. LShl, H. Luna, M. Luong, M. Martins, M. Meyer, P. Michelato, V. Miltchev, W. D. M611er, L. Monaco, W. F. O. Miiller, O. Napieralski, O. Napoly, P. Nicolosi, D. N511e, T. Nufiez, A. Oppelt, C. Pagani, R. Paparella, N. Pchalek, J. Pedregosa-Gutierrez, B. Petersen, B. Petrosyan, G. Petrosyan, L. Petrosyan, J. Pflfiger, E. P16njes, L. Poletto, K. Pozniak, E. Prat, D. Proch, P. Pucyk, P. Radcliffe, H. Redlin, K. Rehlich, M. Richter, M. Roehrs, J. Roensch, R. Romaniuk, M. Ross, J. Rossbach, V. Rybnikov, M. Sachwitz, E. L. Saldin, W. Sandner, H. Schlarb, B. Schmidt, M. Schmitz, P. Schmfiser, J. R. Schneider, E. A. Schneidmiller, S. Schnepp, S. Schreiber, M. Seidel, D. Sertore, A. V. Shabunov, C. Simon, S. Simrock, E. Sombrowski, A. A. Sorokin, P. Spanknebel, R. Spesyvtsev, L. Staykov, B. Steffen, F. Stephan, F. Stulle, H. Thom, K. Tiedtke, M. Tischer, S. Toleikis, R. Treusch, D. Trines, I. Tsakov, E. Vogel, T. Weiland, H. Weise, M. WellhSfer, M. Wendt, I. Will, A. Winter, K. Wittenburg, W. Wurth, P. Yeates, M. V. Yurkov, I. Zagorodnov, and K. Zapfe, Nature Pho-ton. 1, 336 (2007).
  • 2P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F.-J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Mi- ahnahri, S. Moeller, H.-D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. ~rner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, Nature Photon. 4, 641 (2010).
  • 3J. P. Cryan, J. M. Glownia, J. Andreasson, A. Belkacem N. Berrah, C. I. Blaga, C. Bostedt, J. Bozek, C. Buth, L F. DiMauro, L. Fang, O. Gessner, M. Guehr, J. Hajdu M. P. Hertlein, M. Hoener, O. Kornilov, J. P. Marangos A. M. March, B. K. McFarland, H. Merdji, V. S. Petrovi~ Raman, D. Ray, D. Reis, F. Tarantelli, M. Trigo, J. L White, W. White, L. Young, P. H. Bucksbaum, and R N. Coffee. Phys. Rev. Lett. 105, 083004 (2010).
  • 4M. Krikunova, T. Maltezopoulos, A. Azima, M. Schlie, U. Frfihling, H. Redlin, R. Kalms, S. Cunovic, N. M. Kabachnik, M. Wieland, and M. Drescher, New J. Phys. 11, 123019 (2009).
  • 5Q. Zhou and X. Zhang, Chin. Opt. Lett. 9, 110006 (2011).
  • 6T. E. Glover, R. W. Schoenlein, A. H. Chin, and C. V. Shank, Phys. Rev. Lett. 76, 2468 (1996).
  • 7M. Meyer, D. Cubaynes, P. O'Keeffe, H. Luna, P. Yeates, E. T. Kennedy, J. T. Costello, P. Orr, R. Ta'ieb, A. Ma- quet, S. Diisterer, P. Radcliffe, H. Redlin, A. Azima, E. Plonjes, and J. Feldhaus, Phys. Rev. A 74, 011401 (2006).
  • 8S. Dusterer, P. Radcliffe, C. Bostedt, J. Bozek, A. L. Cavalieri, R. Coffee, J. T. Costello, D. Cubaynes, L. F. DiMauro, Y. Ding, G. Doumy, F. Griiner, W. Helml, W. Schweinberger, R. Kienberger, A. R. Maier, M. Messer- schmidt, V. Richardson, C. Roedig, T. Tschentscher, and M. Meyer, New J. Phys. 13, 093024 (2011).
  • 9U. Fruhling, M. Wieland, M. Gensch, T. Gebert, B. Schiitte, M. Krikunova, R. Kalms, F. Budzyn, O. Grimm, J. Rossbach, E. P15njes, and M. Drescher, Nature Pho- ton. 3, 523 (2009).
  • 10I. Grguras, A. R. Maier, C. Behrens, T. Mazza, T. J. Kelly, P. Radcliffe, S. Diiesterer, A. K. Kazansky, N. M. Kabachnik, T. Tschentscher, J. T. Costello, M. Meyer, M. C. Hoffmann, H. Schlarb, and A. L. Cavalieri, Nature Photon. 6, 851 (2012).
Chinese Optics Letters
2013年 第9期

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部