摘要
本文给出了n端品S参数测量修正失配误差的视在S参数和广义S参数的闭式解,推广了重归一化S参数和Γ-R参致闭式解的应用范围;给出了重归一化S参数闭式解的严格证明,分析了视在S参数闭式解的稳定性。文中对四种闭式解作了数值验证。
The closed solutions of apparent S parameters and generalized S parameters used to revise mismatching errors in the measurements of n terminal pair S parameters are given. The application of the closed solutions of the renormalized S parameters and Г-R parameters is generalized, and the rigorous proof of the closed solutions of the renormalized S paramet ers is also given. The stability of the closed solutions of the apparent S parameters is analyzed. The numerical verification of the above four kinds of the closed solutions is given.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1991年第2期44-49,共6页
Acta Electronica Sinica
