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一种谐振式MEMS压力传感器单芯片级真空封装和低应力组装方法 被引量:3

A Single-Chip Vacuum Package and Low-Stress Assembling Method for Resonant MEMS Pressure Sensor
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摘要 为提高谐振式MEMS压力传感器的品质因数,且同时降低温度漂移,设计了一种传感器的单芯片级真空封装和低应力组装方法,选用非光敏苯并环丁烯(BCB)材料在真空加热、加压条件下实现PYREX7740玻璃空腔与传感器芯片的黏合键合,在可伐合金管座上加工出与传感器尺寸相匹配的方形空腔,实现传感器芯片的低应力组装.实验结果表明:传感器具有较高的品质因数(9455),检测范围为500—1100hPa,灵敏度为9.6Hz/,hPa,满量程最大非线性度为0.08%,-40℃-50℃内温度系数为0.9Hz/℃,温度总漂移为传感器满量程变化的1.3%,传感器在开机加电稳定后长时漂移为0.086%F.S. In order to increase the Qfactor and reduce the temperature drift of the resonant MEMS pres sure sensor, a singlechip vacuum package and lowstress assembling method for a resonant pressure sen sor was proposed in this paper. The vacuum package of the resonator and a PYREX 7740 glass with a patterned cavity was conducted by adhesive bonding using nonphotosensitive benzocyclobutene(BCB) in a vacuum heating and pressuring condition, followed by the embedding of the packaged sensor into a Kovar metal substrate with a corresponding square cavity for device lowstress assembling. Experimental results show that the Qfactor and sensitivity of the packaged resonant pressure sensor are quantified as 9 455 and 9.6 Hz/hPa, respectively, in the detection range of 500 1 100 hPa. Further performance measurement produced a maximum nonlinearity of O. 08% F.S. (5001 100 hPa) , a temperature coeffi cient ofO. 9 Hz/℃ and a total temperature drift of 1.3% F.S. ( 40 ℃-50 ℃ ) as well as a longterm drift of O. 086% F.S. in the steady working mode.
出处 《纳米技术与精密工程》 CAS CSCD 2013年第6期492-496,共5页 Nanotechnology and Precision Engineering
基金 北京市科技计划支持资助项目(D111100001611002)
关键词 MEMS 谐振式压力传感器 真空封装 低应力组装 黏合键合 MEMS resonant pressure sensor vacuum package low-stress assembling adhesive bonding
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