摘要
对化学共沉淀法制备的 3Y TZP ,3Y2Ce TZP(3%Y2 O3 2 %CeO2 ZrO2 )和 3Y4Ce TZP(3%Y2 O3 4%CeO2 ZrO2 )纳米粉末进行了 1 450℃无压烧结 ,研究了这 3种TZP陶瓷在 2 50℃水蒸汽中时效 1 50h前后抗弯强度和显微结构的变化 .此外 ,结合红外光谱和EDAX能谱分析 ,探讨了 3Y TZP的时效老化机理 .结果表明 :随着CeO2 含量增加 ,TZP时效后抗弯强度的降低幅度减小 ,3Y4Ce TZP几乎不发生时效老化现象 ;在时效过程中 ,3Y4Ce TZP表面形成了CeO2 保护层 ,防止了Y OH键的形成 ,从而有效地抑制了t→m时效相变 .
Nanometer powders of 3Y TZP, 3Y2Ce TZP(3%Y 2O 3 2%CeO 2 ZrO 2), and 3Y4Ce TZP(3%Y 2O 3 4%CeO 2 ZrO 2) which were prepared by coprecipitation method were pressureless sintered at 1 450 ℃ for 2 h. The emphasis was on the studies of variations of bending strength and microstructure before and after aging in 250 ℃ water vapour for 150 h. The results showed that when CeO 2 content increased, bending strength of TZPs was found to decrease slowly, and 3Y4Ce TZP showed no degradation. Combined with IR and EDAX techniques, aging degradation mechanism for 3Y TZP was investigated. It was proved that CeO 2 protecting layer formed during aging was useful to prevent Y OH bond formation, so t→m aging phase transformation was also effectively prevented. [
出处
《中南工业大学学报》
CSCD
北大核心
2000年第4期335-338,共4页
Journal of Central South University of Technology(Natural Science)
基金
粉末冶金国家重点实验室基金资助项目!( 970 6 36)