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电子束刻蚀中邻近效应的修正

Proximity Effect Correction for Electron Beam Lithography
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摘要 以拓展的三高斯邻近效应函数为基础,利用空间图形密度方法对电子刻蚀中的邻近效应进行修正,并对该方法的原理及实现步骤进行了较为详细的介绍.通过和传统的邻近函数为基础得到的修正结果相比,经过拓展后的邻近函数有着更好的修正效果. The area density map method based on three Gaussian proximity function was used to correct proximity effect respectively, and the principle of this method and steps were introduced in detail. Through com- paring correction results based on the new proximity function with the results based on the conventional proximity function, it is proved that this method is better.
作者 肖沛
出处 《佳木斯大学学报(自然科学版)》 CAS 2013年第6期957-960,共4页 Journal of Jiamusi University:Natural Science Edition
关键词 邻近效应 邻近函数 电子束刻蚀 高斯函数 proximity effect proximity function electron beam lithography Gaussian function
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参考文献14

  • 1G. P. Watson, L. A. Fetter, J. A. Uddle Dose Modification Prox-imity Effect Correction Scheme with Inherent Forward ScatteringCorrections[ J] J. Vac. Sci. Technol. B,1997,15 ( 6) :2309 -2312.
  • 2S. J. Wind,P. D. Gerber, H. RthuizenAccuracy and Efficiency inElectron Beam Proximity Effect Coirection[ J] J. Vac. Sci. Techn-ol.B,1998,16(6) :3262 -3268.
  • 3Y. WangtW, H_ Han,X. Yang at el. An Efficient Dose - Com-pensation Method for Proximity Effect Correction[ J] J. Semicon-ductors ,2010,31 (8) :086001.
  • 4M. Parikh Calculation of Changes in Pattern Dimensions to Com-pensate for Proximity Effects in Electron Lithography [J] J. Appl.Phys.,1980,51:705.
  • 5肖沛,林季资.图形改正方法在邻近效应修正中的应用[J].电子显微学报,2008,27(5):375-378. 被引量:1
  • 6K. L. Todd Theory and Practice of Proximity Correction by Sec-ondary Exposure[ J] J. Appl. Phys. ,1989,65:1776.
  • 7T. Kasuga,M. Konishi Studies on Correction Accuracy of Proximi-ty Effect for the Pattern Area Density Method in Electron BeamDirect Writing[J] J. Vac. Sci. Technol. B, 1996,14(6) :3870 -2873.
  • 8C. S. Ea, A. D. BrownEnhanced Pattern Area Density ProximityEffect Correction[ J]. Vac. Sci. Technol. B, 1999,17(2) :323 -333.
  • 9K. Takahashi,M. Osawa Proximity Effect Correction Using PatternShape Modification and Area Density Map[ J] J. Vac. Sci. Techn-ol. B,2000,18(6) :3150-2157.
  • 10M. Osawa, K. Takahshi Proximity Effect Correction Using Pat-tern Shape Modification and Area Density Map for Electron -Beam Projection Lithography[ J] J. Vac. Sci. Technol. B,200l,19(6):2483 - 2487.

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