期刊文献+

PCB信号完整性测试技术研究 被引量:6

The development of PCB signal integrity test technology
下载PDF
导出
摘要 随着电子产品和设备工作频率和速率的提高,PCB信号完整性研究是近年来炙手可热的技术点。如何测试PCB信号完整性才是最准确的争论一直没有停止且随着技术的发展愈加激烈。大体上,IBM、CISCO等大公司在信号测试方面各具特色,INTEL也逐渐形成了一套单独的测试方法。除此之外,对于大批量PCB生产中的插入损耗监控也是一大课题。本文将对PCB信号完整性测试技术的发展和现状做一个简要总结,对比各种测试方法的优劣。 PCB signal integrity research has been a popular technology for a very long time. It never stopped the argument on how to measure SI as the best rnethod. Mainly there are important companies like IBM and CISCO who own their own spectacular measurement coupons and procedure, also INTEL had developed an effective method on testing insertion loss too. Besides, figuring out how to supervise insertion loss in volume manufhcture of PCB is still a long road. The article will give a brief summary on the developing and status of testing signal integrity, which would be compared to each other as well.
出处 《印制电路信息》 2014年第1期30-34,37,共6页 Printed Circuit Information
关键词 插入损耗 信号测试 信号完整性 Insertion Loss Measurement High Speed Material Signal Integrity
  • 相关文献

参考文献5

  • 1张贤士.信号完整性基础知识[M].中兴通讯上海第一研究所,2000:25.
  • 2于争.信号完整性揭秘[M].机械工业出版社.2013:110,184.
  • 3JeffLoyer和Richard Kunze. SET2DIL: Method to Derive Differential Insertion Loss from Single-Ended TDR/TDT Measurements[C].英特尔技术论文,2010:3,4,5,6.
  • 4NetworkAnalyzer[C].安捷伦技术论文:5,6.
  • 5Roger Stancliff和Joel Dunsmore, Tile Evolution of RF/Microwave Network Analyzers,发展伦技术论文:2,3.4,5.

共引文献1

同被引文献27

引证文献6

二级引证文献10

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部