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Design Near-threshold Photoelectron Imaging Spectrometer Based on UV Laser Induced Photoelectron Emission Anion Source

Design Near-threshold Photoelectron Imaging Spectrometer Based on UV Laser Induced Photoelectron Emission Anion Source
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摘要 We have developed a compact photoelectron imaging facility, including an anion source with dissociative photoelectron attachment to molecules, a linear time-of-flight mass spec-trometry (TOFMS), and an orthogonal high-resolution threshold photoelectron velocity map imaging spectrometer (VMI). Intense and cold cluster anions were prepared in photoelectron- attachment processes upon pulsed UV laser ablation of metal target. Combining this anion source with TOFMS-VMI, the achieved mass resolution is about 200, and the electron ki- netic energy resolution is better than 3%, i.e., 30 meV for 1 eV electrons. More importantly, low-energy photoelectron imaging spectra for CH3S- and S2- at 611.46 nm are obtained. In both cases, the refined electron affinities are determined to be 1.86264-0.0020 eV for CH3S and 1.67444-0.0035 eV for S2, respectively. Preliminary results suggest that the apparatus is a powerful tool for estimating precise electron affinities values from threshold photoelectron imaging spectroscopy.
出处 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 2013年第6期774-779,I0005,共7页 化学物理学报(英文)
关键词 Threshold photoelectron imaging Dissociative photoelectron attachment Laser induced photoelectron emission 光电子发射 成像光谱仪 负离子源 激光诱导 阈值 紫外 飞行时间质谱 质量分辨率
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