摘要
分别采用金相法、扫描电镜EDX能谱、光电直读光谱法测试4032铝合金铸锭表面偏析层厚度。结果发现,采用光电直读光谱法虽能准确检测出偏析层厚度,但检测过程繁琐且检测费用较高;而采用扫描电镜EDX法很难准确地检测出偏析层厚度;采用金相法能简单、快速地检测出偏析层厚度,铸锭表面到粗大α-Al树枝晶的距离即为偏析层厚度。
Surface segregation layer thickness of 4032 alloy was examined by EDX spectroscopy, photoelectric direct reading spectrometer and metallographic method. The results show that photoelectric direct reading spectrometer can accurately detect the thickness of segregation layer. However, the process is cumbersome and expensive. It is difficult to accurately detect segregation layer by EDX analysis. Metallographic method can quickly and easily detect the thickness of segregation layer, which is the distance from the surface of ingots to coarse dendrite of ingot surface.
出处
《特种铸造及有色合金》
CAS
CSCD
北大核心
2014年第3期318-319,共2页
Special Casting & Nonferrous Alloys
关键词
4032铝合金
偏析层厚度
EDX能谱
光电直读光谱
4032 Alloy, Segregation Layer Thickness, EDX Analysis, Photoelectric Direct Reading Spectrometer
