摘要
采用粉末直接压片法,通过基体校正方法,用X射线荧光光谱法测得硅铁中Si,Mn,P,Cr,Al,Ca含量。此方法简便、准确。用10个标准物质制定了工作曲线,并进行了自测。另用2个标准物质作为未知样对工作曲线进行准确度和精度测试,结果令人满意。
This study developed a new analytical method for detecting the contents of several elements （Si,Mn,P,Cr,Al and Ca） in ferrosilicon.This method employs X-ray fluorescence spectrometry using matrix correction method,and the samples needs to be prepared by direct powder compression.The working curve was obtained through ten reference materials.The accuracy and precision of this curve was detected through self-test and another two reference materials.The results showed that this new method was more convenient and accurate than formerly used ferrosilicon analytical methods.
出处
《矿冶》
CAS
2014年第2期88-90,共3页
Mining And Metallurgy
