摘要
水树枝是交联电缆的主要缺陷,相关研究表明,超低频介质损耗因数与交联电缆水树劣化状态具有较强相关性。笔者通过使用皮尔逊相关系数法,对国际电气电子工程师协会IEEE P4002.9/D9—2010推荐的超低频电压下介损平均值、介损变化率与介损随时间的稳定性3个评价指标,与交联电缆绝缘内部水树枝的密度、长度进行了相关性分析,研究结果对于采用上述指标评估水树枝的生长特性具有较好的理论价值与指导作用。
As the main defect of the cross-linked polyethylene（XLPE）, water tree has a good correlation to tanδ under very low frequency（VLF）. This paper studied the correlations between water tree and three indexes of VLF-tanδ： the average values of tanδ, differential tanδ, tanδ stability which is suggested by Institute of Electrical and Electronics Engineers IEEE P4002.9/D9—2010 by using person correlation coefficient. Accordingly, it was suggested that these indexes could be used to describe the growth characteristics of water tree of XLPE insulation.
出处
《高压电器》
CAS
CSCD
北大核心
2014年第6期21-25,31,共6页
High Voltage Apparatus
基金
湖北省电力公司2013年科技计划项目(52153213020J)~~
关键词
皮尔逊相关系数
显著性水平
水树枝
介损
pearson correlation coefficient
significance level
water tree
dielectric loss
