摘要
集成电路已经步入基于IP核设计的SoC(System On Chip)时代,使得IP核的复用成为一个关键问题。针对SoC测试封装扫描链设计中的NP Hard问题,提出了一种采用多目标差分进化的测试封装扫描链设计算法,使得封装扫描链均衡化以及使用TSV(Through Silicon Vias)资源最少,通过群体的变异、交叉以及选择操作实现测试封装扫描链的设计。最后,根据国际标准ITC’02 benchmark进行了验证试验。结果表明,与同类算法相比,算法获得了能够获得更短的封装扫描链和更少的TSV资源。
Integrated Circuit has gone into the age of the IP - based SoC （ System on Chip）, which makes the IP core reuse become a key problem. Since SoC test wrapper design for scan chain is a NP Hard problem, we propose an algorithm based on Muti- Objective Differential Evolution （MODE） to design wrapper scan chain. By mutation operation, crossover operation and selection operation, the design of test wrapper scan chain is achieved. Experimental verification is carried out according to the international standard benchmarks in ITC＇02. The results show that the algorithm can obtain shorter longest wrapper scan chains and less TSV, compared with other algorithm.
出处
《仪表技术与传感器》
CSCD
北大核心
2014年第5期73-75,共3页
Instrument Technique and Sensor
基金
国家自然科学基金项目(60766001)
广西信息科学实验中心项目(20130323)
关键词
多目标差分进化
片上系统
封装扫描链
muti-objective differential evolution
system on chip
wrapper scan chain
