摘要
核电磁脉冲 (NEMP)、雷电电磁脉冲 (LEMP)和高功率微波 (HPM)等强电磁脉冲对单片机系统具有很强的干扰和破坏作用。为研究它们对单片机系统的各种效应 ,利用 GTEM室产生的核电磁脉冲 ,对单片机系统进行了辐照效应实验。实验表明 ,单片机系统在强电磁脉冲作用下 ,会出现“死机”、重启动、通讯出错等现象。基于实验 。
Intense electromagnetic pulse,namely nucleus electromagnetic pulse(NEMP), lightning electromagnetic pulse(LEMP) and high power microwave(HPM), can disturb and destroy the single chip computer system. To study this issue, we made irradiation experiments by NEMPs generated by gigahertz transversal electromagnetic(GTEM) Cell. The experiments show that shutdown, restarting, communication errors of the single chip microcomputer system would occur when it was irradiated by the NEMPs. Based on the experiments, the cause on the effects on the single chip microcomputer system is discused.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2001年第5期623-626,共4页
High Power Laser and Particle Beams
基金
国家自然科学基金资助课题 (5 0 0 770 2 4)
关键词
核电磁脉冲
辐照效应
单片机系统
NEMP
single chip microcomputer system
irradiation effects
