摘要
根据系统级BIT设计的要求,明确了系统级BIT设计中测试选择所需解决的问题,提出了测试选择的基本思想;在此基础上,利用系统级故障隔离的间接熵法实现了系统级BIT设计中的测试选择,并引入测试时间和故障发生频率参数对间接熵法进行了修正,获得了可以较快地判断系统是否可用并隔离大概率故障的测试集。理论分析及实验数据表明,该文提出的系统级BIT设计中测试选择方法是有效的。
Test selection is a key process in system-level BIT design.In this paper,in order to solve the problem of test selection optimization,the qualitative requirements of test selection are analyzed,and the basic approach of test selection is set forth in details.Based on that approach,test selection is implemented via indirect-entropy-fault-isolation-algorithm firstly.Then,the algorithm is modified by two parameters:test time and faults probability.Using the modified algorithms,a better test set of system-level BIT can be gained,which is able to determine the state of system under test(usable or unusable)and isolate those faults with high probability more quickly.Theoretical analysis and experimental data have shown that the modified algorithm is effective and efficient.
出处
《计算机工程与应用》
CSCD
北大核心
2001年第19期127-129,153,共4页
Computer Engineering and Applications
