期刊文献+

变间距光栅刻线密度的测试精度分析 被引量:14

The groove density measurement of VLS plane grating by diffraction method
下载PDF
导出
摘要 介绍了衍射法测量变间距光栅线密度的测量系统。该测量系统由激光器、准直镜、光栅转动台(含角度测量仪)、直线工作台、光栅调节架、探测器和待测光栅组成。分析了系统中各种误差对测量精度的影响,以及变间距光栅参数的变化对光学系统的影响和补偿办法。计算表明,该系统的测试精度满足光束线对光学系统的性能要求。 The groove density parameters are important to VLS plane gratings monochromator. It is necesary to make sure that the parameters were specified and their errors were acceptable. A diffraction method was used to measure the groove density of VLS grating for system. It included a light source (He - Ne laser), a collimator, a goniometer with angle encoder, a autocollimator, a linear stages, a detector(CCD) and the guting to be tested. The main error sources in the measuring system were analyzed in details. It turned out that the measuring system proposed was adequated for our purpose. A compensation method was analyzed for the monochromator if the groove density parameters were deviated from the design value.
出处 《核技术》 CAS CSCD 北大核心 2001年第7期557-563,共7页 Nuclear Techniques
关键词 变间距光栅 单色器 刻线密度 同步辐射 测试精度 衍射法 VLS plane grating, Groove density, Monochromator
  • 相关文献

参考文献7

  • 1[1]Takeshi Namioka, Masato Koike. Appl Opt, 1995, 34(13) :2180-2186
  • 2[2]Masato Koike, Raul Beguiristain, James H. Underwood, et al. Nucl Instr Meth Phys Res A, 1994, 347:273-277
  • 3[3]Noda H, Namioka T, Seya M. J Opt Soc Am, 1974, 64(8) :1043-1048
  • 4[4]Kenta Amemiya, Yoshinori Kitajima, Yishiki Yonamoto,et al. SPIE,1997,3150:171-182
  • 5[5]Masaaki ltou, Tatsuo Harada, Toshiaki Kita. Appl Opt,1989,28(1) :146-153
  • 6[6]Beutler H G. J Opt Soc Am,1945,35(5) :311-350
  • 7[7]Noda H, Namioka T, Seya M. J Opt Soc Am,1974,64(8) :1031-1036

同被引文献150

引证文献14

二级引证文献52

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部