摘要
以ZrSiO_4、SiO_2、ZrO_2、钾长石等标准物质及它们的合成标样来拟合校准曲线,建立了X射线荧光光谱(XRF)对锆石等含锆化合物的精确测定,同时测定硅酸锆样品中SiO_2、Al_2O_3、Fe_2O_3、TiO_2、CaO、MgO、K_2O、Na_2O、P_2O_5、SO_3、ZrO_2、HfO_2等主次组分。发现样品与99.5%的四硼酸锂做熔剂在熔融稀释比为1:10时混合均匀,加入NH_4Br为脱模剂的情况下,在1050-1100℃下预熔180 s后熔融900 s并静止10 s,制得测定熔融片,其结果与标准物质认定值基本一致,各组分测定结果的测量误差小于0.5%,相对标准偏差(RSD,n=5)小于10%。
The calibration curves were fitted with standard materials such as ZrSiO4,SiO2,ZrO2,K-feldspar and their standard synthetic specimens.X-ray fluorescence spectroscopy(XRF)was established to accurately measure zircon-containing compounds such as zirconite and simultaneously determine the main and minor components of zirconium silicate samples such as SiO2,Al2O3,Fe2O3,TiO2,CaO,MgO,K2O,Na2O,P2O5,SO3,ZrO2 and HfO2.The sample was found to be uniformly mixed with 99.5%lithium tetraborate as a solvent at a melt dilution ratio of 1:10.When NH4Br was added as a release agent,it was pre-melted at 1050-1100℃for 180 s,then melted for 900 s and stood still for 10 s.The measured melting sheet is basically the same as the certified value of the standard substance.The measurement error of each component is less than 0.5%,and the relative standard deviation(RSD,n=5)is less than 10%.
作者
梁艳珍
黄健
LIANG Yanzhen;HUANG Jian(Jingdezhen Ceramic Institute,Jingdezhen 333403,Jiangxi,China;Foshan Huaxia Building Ceramic R&D Center,Foshan 528061,Guangdong,China)
出处
《陶瓷学报》
CAS
北大核心
2018年第6期749-754,共6页
Journal of Ceramics
关键词
X射线荧光光谱法
硅酸锆
校准曲线
X-ray fluorescence spectrometry
ZrSiO4
calibration curve
