摘要
本文综述了反射电子显微术(REM)和反射电子能量损失谱(REELS)在表面科学中的应用。较详细地给出了用这些方法研究表面原子结构、化学成份和电子态的基本实验和理论,指出了发展这一学科对表面研究的重要性。
A review is given on the applications of high-energy reflection electron microscopy (REM) and reflection electron energy-loss spectro-scopy (REELS) in surface sciences. Technique details and the associated theories are illustrated about the combination use of REM and REELS for studying the surface atomic structure, its chemical compositions and the related electronic states. The importance of developing these techniques is emphasized.
出处
《物理学进展》
CSCD
北大核心
1991年第1期1-16,共16页
Progress In Physics
