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基于图像变换的自由曲面光学透镜面形测量 被引量:1

Shape measurements of free-form optical lenses using image transform analysis
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摘要 对称中心的自由曲面光学透镜的光学表面面形测量 ,是光学加工制造领域的难题。为达到高精度测量 ,提出一种可用于自由曲面光学透镜在线光学测量方法。基于光学透镜的图像变换特性与其光学表面面形之间存在着的拓扑关系 ,通过对标准输入图像和经过待测自由曲面光学透镜变换后的输出图像进行智能辨识、分析和处理 ,求出该光学透镜的变换矩阵 ,并据此精确测量出待测光学透镜的曲面面形。实验结果表明 :基于图像变换的测量方法的测量误差小于 2~ 3μm,能够适用于自由曲面光学透镜的非接触。 Measurements of the shape of a non-revolving symmetrical free-form optical lens are an important optical fabrication problem. A new high precision method is proposed to measure free-form optical lenses on line. The method uses the topology velationship between the image transform characteristics and the optical surface to precisely reconstructed the lens surface by analyzing input and output images before and after the optical lens. Experimental results show that the measurement error is less than 2~3 μm and this method can meet the needs for non-contact high precision measurements of free-form optical lenses.
出处 《清华大学学报(自然科学版)》 EI CAS CSCD 北大核心 2002年第6期747-749,757,共4页 Journal of Tsinghua University(Science and Technology)
基金 国家自然科学基金资助项目 ( 5 0 175 0 6 2 ) 国家"八六三"高技术研究发展计划资助项目 ( 2 0 0 1AA42 114 0 )
关键词 图像变换 自由曲面光学透镜 面形测量 free-form optical lenses image transforms optical measurements
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  • 1[1]Negishi M, Ando M, Takimoto M, et al. A super-smooth polishing for aspherical surfaces-high-precision coordinate measuring and polishing systems [A]. SPIE [C], 1995, 2576: 336-342.
  • 2[2]Beraud P, Espiard J, Geyl R, et al. Optical figuring and testing of the VLT 8.2-m primary mirrors [A]. SPIE [C]. 1995, 2536: 41-46.
  • 3[3]Paul W B, Jack D, Sam D. Fabrication and thermo-optical properties of the MLS composite primary reflector [A]. SPIE [C], Denver, Colorado, 1999, 3786: 200-205.
  • 4[4]Beraud O P. Figuring and testing of the VLT 8.2-m primary mirror [A]. Proc SPIE [C], 1995, 2536: 413-419.
  • 5[5]Aspden R, McDonough R, Nitchie F R. Computer assisted optical surfacing [J]. Applied Optics, 1972, 11(12): 2739-2747.
  • 6[6]Wolfe C R, Lawson J K, Kellam M, et al. Measurement of wavefront structure from large aperture optical components by phase shifing interferometry [A]. SPIE [C], 1995, 2536: 13-26.

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