摘要
随着电子电器类产品的高速发展,ITE产品的工作频率越来越高,电子产品彼此之间干扰的影响频率范围也在不断扩大,辐射抗干扰的测试频率范围在提升,同时对辐射抗干扰测试的场地要求也越来越重视,该文主要介绍辐射抗干扰场地的校准方法和校准问题的处理。
The rapid development of electronic and electrical products,ITE products higher work frequency,the frequency range of electronic products of interference between each other is also expanding,radiation interference test in the frequency range of ascension,the radiation immunity test site requirements are also more and more attention,this paper mainly introduces the processing of radiation calibration method and calibration the problem of interference of the venue.
出处
《电子质量》
2014年第7期84-86,共3页
Electronics Quality
关键词
场均匀度
全电波暗室
固定功率法
电压探头
uniform field area
Fully anechoic chamber
constant power calibration
voltage probe
