摘要
依据由电子束物理气相沉积法(Electron Beam Physical Vapor Deposition,EB-PVD)制备的ZrO2-7%(质量分数)Y2O3(Yttria Stabilization Zirconia,YSZ)涂层显微分析结果,采用统计学方法和随机介质理论建立了涂层的随机孔隙模型。针对孔隙率分别为0%,5%,10%且具有不同孔隙形貌的涂层模拟结果,采用数值计算方法得到不同孔隙率及孔隙形貌差异引起的纵波声速变化。结果表明:含孔隙涂层纵波声速明显减小,与致密涂层相比,孔隙率为5%和10%的YSZ涂层,纵波声速分别减小14.4%和23.9%。此外,孔隙率恒定时,孔隙形貌变化也会引起超声纵波速度波动,对于孔隙率5%和10%的涂层,声速波动分别为5.0%和6.8%,该模拟计算结果与对应孔隙率的实验测量结果5.9%和7.5%是相当的。
To describe the non-uniform microstructure of ZRO2-7% （mass fraction） Y2Oa deposited by EB-PVD, a novel YSZ random void model （RVM） was proposed based on the random media theory and statistical analysis method. The ultrasonic testing of YSZ coatings, whose porosities were 0%, 5% and 10%, respectively, were simulated with finite difference time domain （FDTD） method. The variation of the longitudinal wave velocity caused by the porosity and void morphology was analyzed. Results show that the velocity decreases with the increase of porosities in YSZ coatings. In the case of 5% and 10% porosity, the decreased values are 14.4% and 23.9%, respectively, compared with that of the dense coating. Furthermore, the corresponding velocity fluctuations caused by the difference of void morphology are 5% and 6.8%, respectively, which match with 5.9% and 7.5% of experimental results.
出处
《材料工程》
EI
CAS
CSCD
北大核心
2014年第5期86-90,共5页
Journal of Materials Engineering
