摘要
为实现装备保障快速检测、修理与维护,基于对STM32F103VF系列微控制器的研究,开发新型采集测试系统。文章主要对测试通道设计和精度需求进行分析,并应用于测试某型便携导弹发控设备,满足对装备实测要求,降低了电源的要求,大大缩小测试电路的尺寸,对测试设备实现了极大的小型化和便携化[1],同时满足战场快速技术保障的战斗力要求。
To achieve rapid detection ,support and maintenance for equipment support ,a new testing system based on the series of STM32F103VE microcontrollers is developed .The test channels design and precision needs are analyzed ,and the testing of a certain type of the missile launch and control equipment is realized .The experiment result shows that the tes‐ting system is fully able to meet the requirements of the equipment ,reduce power requirements ,and significantly decrease the size of the test circuit .It makes test equipment achieve a greatly miniaturized and portable ,and meet the rapid technolog‐ical safeguards requirements of battlefield combat at the same time .
出处
《计算机与数字工程》
2015年第2期187-190,219,共5页
Computer & Digital Engineering
