摘要
基于VMM方法学设计和实现了一个随机验证环境,验证一个64位ALU。该验证环境具备一套功能完备的随机测试程序发生器,可以生成覆盖率指导的有约束的定点、浮点指令序列,调用一个由C语言实现的参考模型进行运算结果自检,并采用覆盖率收敛技术实现覆盖率快速收敛。实践结果表明,设计的随机验证环境,能够高效验证ALU的各项逻辑功能,减少测试时间,且随机测试程序生成模块可以简单移植应用于处理器其他模块的功能验证。
A random test-bench was designed and completed on the basis of VMM to verify a 64-bit ALU. The test-bench has a coverage directed random test program generator and can generate different kinds of flexed point and floating point instruction arrays,which a reference model realized by C language can be called to check out the operation results automatically,and can implement the rapid convergence of coverage rate by coverage convergence technology. The practice results show that the test-bench can verify each ALU logic function effectively,shorten the verification time,and test the module randomly generated by program,and can be used in other processor module function verification by simple transplantation.
出处
《现代电子技术》
北大核心
2015年第7期144-147,共4页
Modern Electronics Technique
基金
国家自然科学基金(51465011)
