摘要
For electronic piezo gauge used for testing gun chamber pressure, its internal miniature pulse-powered photoelectric invert switch cannot often be powered up normally. To solve this problem, a test system for invert switch is presented to verify the reliability of the invert switch. The test system uses complex programmable logic device （CPLD） to control data acquisition of A/D converter and data storage of external flash memory, and then transmits the acquired data to a computer for data analysis and processing. The test system can provide the required sampling frequency of the signal in high temperature, normal temperature and low temperature environments, and the reliability of the invert switch can be verified according to the signal parameters. The results show that the test system has high precision and the tested invert switch has low power consumption and high reliability.
