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基于MCNP5的凸度仪固有散射影响分析

Analysis of Inherent Scattering Based on MCNP5 for Profile Gauge
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摘要 本文采用MCNP5软件建立了凸度仪模拟计算模型,并对其进行实验结果验证。分析了凸度仪固有散射的影响,随待测钢板厚度的增大,固有散射影响减小,对1~15mm厚度的钢板,系统固有散射占总散射影响的10%以下,而对大于15mm厚度的钢板,系统固有散射可近似为零。此外,对散射因子曲线在非对应源附近的鼓包现象进行了分析,分析结果表明,探测器支架具有防止另一排探测器散射干扰的作用。 In this paper, based on MCNP5, the simulation model of profile gauge was established and verified by the experimental data. The inherent scattering of profile gauge was analyzed. The value of inherent scattering decreases with the increase of steel plate thickness. For the thickness of 1 mm to 15 mm, the inherent scattering accounts for less than 10% of the total scattering effect, and for over 15 mm thickness steel plate, inherent scattering can be approximated as zero. In addition, the analysis result of the bulge phenomenon for the scatter-to-primary ratio (SPR) curve proves that the detector stent can prevent another detector row's scattering.
出处 《原子能科学技术》 EI CAS CSCD 北大核心 2015年第8期1477-1482,共6页 Atomic Energy Science and Technology
基金 北京市科委研发攻关课题资助项目(Z080903027508)
关键词 散射校正 凸度仪 MCNP5 scattering correction profile gauge MCNP5
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