期刊文献+

CUSUM控制图在印刷电路板生产过程中的应用研究

Study on the Application of CUSUM Control Chart in the Production Process of PCB
下载PDF
导出
摘要 经典的休哈特控制图对质量特征值的均值波动检出力较弱。采用均值-极差控制图控制印刷电路板锡浆厚度在短期内往往很难发现印刷锡浆厚度偏差的偏移,导致印刷锡浆厚度偏差调整不及时。为了提高检出力,采用累积和控制图(CUSUM)来控制印刷锡浆厚度偏差的变化,改进了印刷锡浆厚度偏差调整方式,在保证质量的同时降低了生产成本。 Traditional Shewhart control charts have low power in detecting mean shift of quality characteristic values. When an mean-range control chart(X-R)is used to control its deviations of thickness of solder pasteprinting amount, it is found that X-R is too insensitive to the shift of the deviations and unable to calibrate itssolder paste printing machines in time. A CUSUM control chart is used to control the variation of the deviation of solder paste-printing and to improveits shift modes,and to improve machine calibration, which results in high quality and low cost in solder paste printing process.
机构地区 长安大学理学院
出处 《河南科技》 2015年第5期43-45,共3页 Henan Science and Technology
基金 中央高校基本科研地下水毛细带渗流特性(3108-2913-0225)
关键词 均值-极差控制图 累积和控制图 检出力 mean-range control chart CUSUM control chart detectionpower
  • 相关文献

参考文献9

二级参考文献17

  • 1王前洪,张宇.累积和控制图与传统控制图同时监控过程均值[J].机械工程与自动化,2006(2):4-6. 被引量:7
  • 2[1]Montgomery Douglas C. Introduction to Statistical Quality Control [M]. 3rd edition. John Wiley & Sons Inc, 1996. 314-330.
  • 3[2]Hawkins D M. A CUSUM for a Scale Parameter[J]. Journal of Quality Technology. 1981, 13(4):228-231.
  • 4[3]Lucas J M. The design and use of V-mask control Scheme[J]. Journal of Quality Technology. 1976,8(1):1-12.
  • 5[4]Thomas P R. Statistical Method for Quality Improvement [M]. John Wiley & Sons Inc, 1989. 102-118.
  • 6[5]Lucas J M, Crosier R B. Fast Initial Response for CUSUM Quality Schemes: Give Your CUSUM a Head Start[J]. Technometrics, 1982, 24(3):119-205.
  • 7[2]毛宏,游发华,刘朝容.现代质量控制图技术[M].武汉:武汉工业大学出版社,1996.
  • 8Chrysler Corporation,Ford Motor Company,General Motor Corporation. Measurement System Analysis Reference Manual [M]. Troy, Mich: Automotive Industry Action Group, 1995. 107-109
  • 9Page E S. Continuous inspection scheme [J]. Biometrika, 1954, 41: 100-104
  • 10Hawkins D M. A CUSUM for a scale parameter [J]. Journal of Quality Technology, 1981,13(4): 228-231

共引文献28

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部