期刊文献+

印制电路板在板级跌落冲击的易损度探究 被引量:2

Vulnerability of Printed Circuit Board in Level Drop Impact
下载PDF
导出
摘要 目的研究标准冲击载荷下印制电路板的挠度响应以及各参数对电路板脆值的影响。方法考虑印制电路板在三角脉冲下的跌落冲击,将四边点支的电路板简化成梁的模型。将脉冲激励考虑为内在的位移,建立模型求解电路板的挠度和加速度响应,进而与电路板的本身特性比较,来考虑电路板的可靠性。结果当受到三角脉冲跌落冲击时,板的最大挠度变形和最大加速度都发生在板的中间位置附近,并且发生在中间时刻。结论为电路板在三角形脉冲下跌落冲击提供其可靠性的理论依据。 The aim of this work was to study the deflection response of printed circuit board under the standard impact load and the influence of different parameters on the brittle value of the circuit board. Considering the drop impact of the printed circuit board under the triangular pulse, the circuit board with four edges was simplified into a beam model. The impulse excitation was considered as the intrinsic displacement, and a model was built to solve the deflection and acceleration response of the circuit board, which were then compared with the features of the circuit board to evaluate the reliability of the circuit board. The maximum deflection and maximum acceleration of the plate both occurred near the middle of the plate, and in the middle of the moment when the plate was impacted by the triangular pulse. In conclusion, the theoretical basis for the reliability of the circuit board under the triangular pulse was provided.
作者 刘宏
出处 《包装工程》 CAS CSCD 北大核心 2015年第17期84-86,99,共4页 Packaging Engineering
关键词 电路板 跌落冲击 三角形脉冲 可靠性 printed circuit board drop impact triangular pulse reliability
  • 相关文献

参考文献9

  • 1WONG E H. Dynamic of Board-level Drop Impact.Transac- tions of the ASME[J]. Journal of Electronic Packaging, 2005, 127 : 496-502.
  • 2WONG E H, MAI Y W, SEAH S K W. Board Level Drop Im- pact-fundamental and Parametric Analysis.Transactions of the ASME[J]. Journal of Electronic Packaging, 2005, 127: 496-502.
  • 3SUHIR E. Could Shock Tests Adequately Mimic Drop Test Conditions Transactions of the ASME[J]. Journal of Electronic Packaging, 2002, 124: 170-177.
  • 4TSAI T Y, YEH C L, LAI Y S. Response Spectra Analysis for Undamped Structural Systems Subjected to Half-sine Impact Acceleration Pulses[J]. Microelectronics Reliability, 2006.
  • 5张波,丁汉,盛鑫军.板级电子封装在跌落冲击载荷下的动态响应分析[J].振动与冲击,2008,27(6):108-113. 被引量:9
  • 6刘芳,赵玫,孟光.电路板组件板级跌落冲击动力学分析[J].机械强度,2007,29(5):713-716. 被引量:7
  • 7杨雪霞,肖革胜,树学峰.板级跌落冲击载荷下无铅焊点形状对BGA封装可靠性的影响[J].振动与冲击,2013,32(1):104-107. 被引量:15
  • 8SINGIRESUSR.机械振动[M].第4版.清华大学出版社,2009.
  • 9彭国勋.物流包装运输设计[M].第2版.北京:印刷工业出版,2006.

二级参考文献29

  • 1JEDEC Standard JESD22-B111.Board level drop test method of components for handheld electronic products,2003.
  • 2Lim C T,Low Y J.Investigating the drop impact of portable electronic products.52nd ECTC Conference Proc.,San Diego,California,USA,2002.1 270-1 274.
  • 3Lim C T,Ang C W.Drop impact survey of portable electronic products.53rd ECTC Conference Proc.,New Orleans,Louisiana,USA,2003.113-120.
  • 4Zhu L P,Marcinkiewicz W.Drop impact reliability analysis of CSP packages at board and product levels through modeling approaches.IEEE Transactions on Components and Packaging Technologies,2005,28:449-456.
  • 5Steingerg D S.Vibration analysis for electronic equipment.2nd ed.,New York:John Wiley,1988.
  • 6Suhir E.Could shock tests adequately mimic drop test conditions? Transactions of the ASME.Journal of Electronic Packaging,2002,124:170-177.
  • 7Wong E H.Dynamics of board-level drop impact.Transactions of the ASME.Journal of Electronic Packaging,2005,127:200-207.
  • 8Wong E H,Mai Y-W,Seah S K W.Board level drop impact-fundamental and parametric analysis.Transactions of the ASME,Journal of Electronic Packaging,2005,127:496-502.
  • 9JEDEC standard JESD22-B111. Board level drop test method of components for handheld electronic products.
  • 10Luan Jing-en, Tee Tong Yan, Pek Eric, et al. Dynamic responses and solder joint reliability under board level drop test [ J ]. Microelectronics Reliability, 2007, 47 ( 2 - 3 ) : 450-460.

共引文献23

同被引文献16

引证文献2

二级引证文献6

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部