摘要
在集成电路测试领域,传输延迟时间tPD是一个非常重要的参数,其不仅反映集成电路对信号的响应速度,也是集成电路测试系统交流参数测量准确的重要影响因素。详细分析了集成电路测试系统传输延迟时间产生的原因,及其对待测器件交流参数测量结果的影响。提出了基于时域反射技术的集成电路测试系统数字通道传输延迟测量方法,并在泰瑞达J750EX集成电路测试系统上进行了实验验证。通过对实验数据的分析,表明该方法能有效测量数字通道传输延迟时间,提高集成电路测试系统交流参数测量准确度。
In the field of integrated circuit （IC） testing, Time Propagation Delay （tPD） is a very important parameter, which not only reflect the response speed of the integrated circuit, but also influences the measurement accuracy of alternating current （AC） parameters in the IC testing system. We analyze the causes of tPD in the IC test system in detail, and study the influence on the testing results of alternating current parameters of the device under test. We propose a measuring method of the digital channel tPD in the IC test system based on the time domain reflection technology,and conduct an experiment in Teradyne＇s J750EX system. Through the analysis of experimental data, we find this method can effectively measure the digital channel＇s tPD,and hence improve the measurement accuracy of the AC parameters in the IC testing system.
出处
《计算机工程与科学》
CSCD
北大核心
2015年第10期1825-1830,共6页
Computer Engineering & Science
关键词
传输延迟时间
时域反射测量
集成电路测试系统
数字通道
time propagation delay
time domain reflection measurement
IC test system
digital channel
