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Experimental study on heavy ion single-event effects in flash-based FPGAs 被引量：2

Experimental study on heavy ion single-event effects in flash-based FPGAs
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摘要 With extensive use of flash-based field-programmable gate arrays(FPGAs) in military and aerospace applications, single-event effects(SEEs) of FPGAs induced by radiations have been a major concern. In this paper, we present SEE experimental study of a flash-based FPGA from Microsemi Pro ASIC3 product family. The relation between the cross section and different linear energy transfer(LET) values for the logic tiles and embedded RAM blocks is obtained. The results show that the sequential logic cross section depends not too much on operating frequency of the device. And the relationship between 0 →1 upsets(zeros) and 1 →0 upsets(ones) is different for different kinds of D-flip-flops. The devices are not sensitive to SEL up to a LET of 99.0 Me V cm2/mg.Post-beam tests show that the programming module is damaged due to the high-LET ions. With extensive use of flash-based field-pro- grammable gate arrays （FPGAs） in military and aerospace applications, single-event effects （SEEs） of FPGAs induced by radiations have been a major concern. In this paper, we present SEE experimental study of a flash-based FPGA from Microsemi ProASIC3 product family. The relation between the cross section and different linear energy transfer （LET） values for the logic tiles and embedded RAM blocks is obtained. The results show that the sequential logic cross section depends not too much on operating frequency of the device. And the relationship between 0 → 1 upsets （zeros） and 1 → 0 upsets （ones） is different for different kinds of D-flip-flops. The devices are not sensitive to SEL up to a LET of 99.0 MeV cm2/mg. Post-beam tests show that the programming module is damaged due to the high-LET ions.
作者 Zhen-Lei Yang Xiao-Hui Wang Hong Su Jie Liu Tian-Qi Liu Kai Xi Bin Wang Song Gu Qian-Shun She
机构地区 Institute of Modern Physics University of Chinese Academy of Sciences
出处 《Nuclear Science and Techniques》 SCIE CAS CSCD 2016年第1期98-105,共8页 核技术（英文）
基金 the National Natural Science Foundation of China(Nos.11079045,11179003 and 11305233)
关键词 Flash 单粒子效应 FPGA 重离子 实验 现场可编程门阵列 设备选择 航天应用 Single-event effects （SEEs） Flash-basedFPGAs HIRFL Heavy ion experiments
分类号 TN791 [电子电信—电路与系统] TP317.4 [自动化与计算机技术—计算机软件与理论]
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参考文献22

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Nuclear Science and Techniques
2016年 第1期

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