摘要
The objective of this paper is to discuss the issue of the projection uniformity of asymmetric fractional factorials.On the basis of Lee discrepancy,the authors define the projection Lee discrepancy to measure the uniformity for low-dimensional projection designs.Moreover,the concepts of uniformity pattern and minimum projection uniformity criterion are proposed,which can be used to assess and compare two and three mixed levels factorials.Statistical justification of uniformity pattern is also investigated.
基金
supported by the National Natural Science Foundations of China under Grant Nos.11271147 and 11401596
