摘要
电子显微镜(electron microscopy,EM)是20世纪最重要的发明之一,其特有的高分辨率,在植物病害检测、超微结构及形态观察中发挥了重要作用。对目前常用的透射电子显微镜,扫描电子显微镜、环境扫描电子显微镜、扫描隧道显微镜及原子力显微镜等新型电镜的原理及其在植物病害研究中的应用作一介绍,旨在为更好的运用电镜技术提供参考。
Electron microscopy（EM）is the most important invention in the 20 th century. The EM plays a great role in detection of the plant disease and observation of ultrastructure and morphology because of its high resolution. The principles of electron microscopes commonly used at present and their applications in the plant disease research were introduced in this article,including transmission electron microscope（TEM）,scanning electron microscope（SEM）,environmental scanning electron microscope（ESEM）,scanning tunneling microscope（STM）and atomic force microscope（AFM）. This article is aimed to provide reference for the better utilization of electron microscopy.
出处
《生物技术通报》
CAS
CSCD
北大核心
2016年第3期38-43,共6页
Biotechnology Bulletin
基金
国家公益性行业(农业)科研专项(201203076)
国家科技支撑子课题(2012BAD19B06)
重庆市两江学者项目
中央高校基本科研业务费(XDJK2014A001)
关键词
超微结构
电子显微镜
植物病害
ultrastructure
electron microscope
plant diseases
