地铁列车网络控制系统的性能分析被引量：1

Performance analysis of metro train network control system

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摘要以北京地铁6号线列车网络控制系统TCMS为例,分析了TCMS的性能以及主要部件的性能,并介绍了网络故障及处理措施。 Taking the train network control system TCMS of Beijing Subway Line 6 for an example, the performance of TCMS and its major components are analyzed and the network fault and treatment measures are introduced.

作者王锋

机构地区中车大连电力牵引研发中心有限公司

出处《铁道机车与动车》 2016年第4期35-37,6,共3页 Railway Locomotive and Motor Car

关键词地铁列车 TCMS 性能分析 metro train TCMS performance analysis

分类号 U231.8 [交通运输工程—道路与铁道工程]

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1刘建伟,王蕾,谭南林,焦风川,高小明.轨道车辆MVB通信网络的实时特性[J].中国铁道科学,2006,27(6):79-83. 被引量：16
2聂晓波,王立德,申萍.轨道车辆MVB网络实时性能分析与优化研究[J].铁道学报,2011,33(9):40-44. 被引量：24

二级参考文献16

1赵鹏,徐宁.现场总线及接口网桥技术在BTM中的应用[J].中国铁道科学,2004,25(6):129-133. 被引量：3
2姚兰,李瑞芳,桂勋,谭永东.自律分布数字化列车控制系统及在线扩展技术[J].中国铁道科学,2005,26(1):90-94. 被引量：2
3刘建伟,谭南林,焦风川,邢然,高小明.多功能车辆总线系统性能分析[J].铁道学报,2006,28(6):83-87. 被引量：13
4朱琴跃,谢维达,谭喜堂.MVB协议一致性测试研究与实现[J].铁道学报,2007,29(4):115-120. 被引量：26
5International Electrotechnical Commission. IEC61375-1. Electric Railways Equipment-Train Bus-Part1: Train Communication Network[S]. Geneva, Switzerland:IEC,2007.
6JAIME J, IKER H, CARLOS C, JON A, et al. Simulation of Message Data in a Testbench for the Multifunction Vehicle Bus[C]//32nd Annual Conference of the IEEE Industrial Electronics Society. Paris, France: IEEE, 2006: 4666 -4671.
7Tengdin J T,Simon M S,Sufana C R.LAN Congestion Scenario and Performance Evaluation[A].Proceedings of IEEE Power Engineering Society 1999 Winter Meeting[C].USA:IEEE Press,1999:919-924.
8Skeie T,Johannessen S,Brunner C.Ethernet in Substation Automation[J].IEEE Control Systems Magazine,2002,22 (3):43-51.
9Ng J K Y,Liu J W S.Performance of Local area Network Protocols for Hard Real-Time Applications[A].Proceedings of the 11th International Conference on Distributed Computing Systems[C].USA:IEEE Press,1991:318-326.
10Mohammed F A,Ayad N M A,Esmat H,et al.Performance Analysis of Access Media Protocols in Local Networks[A].Proceedings of IEEE Symposium on Computers and Communications[C].USA:IEEE Press,1997:249-253.