期刊文献+

基于噪声测量技术的开关电源故障诊断方法研究 被引量:5

Research of Switch Power Supply Fault Diagnosis Method Based on Noise Measurement Technology
下载PDF
导出
摘要 针对开关电源的功率器件MOS管工作在高功率大电流下易损坏,导致开关电源故障率高的问题,提出了一种利用噪声测量技术来判断其工作状态的故障诊断新方法。建立了功率MOS器件的噪声模型,设计了超低噪声前置低频放大器,对伊莱科S-15-12型开关电源测试,结果表明,该方法能够测量到开关电源的低频噪声并准确判断其工作状态,且在准确率上较传统方法提高了65%,为开关电源故障诊断提供了一种有效的方法。 The MOS devices,as a core of the switching power supply,working in high power electromagnetic flow is easy to be damaged,which can make the switching power supply work anormally,the problem of a proposed noise measuring technology of high failure rate is used to judge the working condition. This new method of fault diagnosis established a power MOS device noise model ,designed the low noise front low frequency amplifier ,and tested S-15-12 of Ilecco type switching power supply. The results show that the method can measure the low frequency noise of switching power supply and accurately determine its working status,and increase 65%than the traditional methods on accuracy. The typical fault diagnosis method of switching power supply provides a feasible and effective evaluation method.
出处 《电子器件》 CAS 北大核心 2016年第3期723-727,共5页 Chinese Journal of Electron Devices
基金 浙江省教育厅科研项目Y201534925
关键词 开关电源 MOS器件 故障诊断 低频噪声 switching power supply MOS device fault diagnosis low frequency noise
  • 相关文献

参考文献6

二级参考文献45

  • 1包军林,庄奕琪,杜磊,李伟华.基于虚拟仪器的电子器件低频噪声测试分析系统[J].仪器仪表学报,2004,25(z1):351-353. 被引量:23
  • 2周求湛,杨熙春,王墨林,卢昊.基于LabVIEW的光耦低频噪声成分估计研究[J].测试技术学报,2005,19(2):234-236. 被引量:2
  • 3胡瑾,杜磊,庄奕琪,何亮,包军林,黄小君,陈春霞,卫涛.光电耦合器电流传输比的噪声表征[J].Journal of Semiconductors,2007,28(4):597-603. 被引量:12
  • 4G. Scandurra, C. Ciofi. Multi-channel Cross-correlation for Increasing Sensitivity in Voltage Noise Measurements [C]. IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2012: 1524-1528.
  • 5G. Seandurra, G. Giusi, C. Ciofi. Multichannel Amplifier Topologies for High-sensitivity and Reduced Measurement Time in Voltage Noise Measurements [J]. IEEE Transactions on Instrumentation and Measurement, 2013,62(5): 1145-1153.
  • 6G. Scandurra, C.Ciofi. hnpedance Meter Based on Cross- Correlatioo Noise Measurements [C], 2011 21st International Conference on Noise and Fluctuations (ICNF), 2011:381- 384.
  • 7F.A. Levinzon. Noise of the JFET Amplifier [J]. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, 2000,47 (7): 981-985.
  • 8谭超,董浩斌.低频μV信号放大器的设计与制作[J].电测与仪表,2007,44(11):55-58. 被引量:9
  • 9Schwank J R,Ferlet-Cavrois V,Shaneyfelt M R,Paillet P,Dodd P E,2003.IEEE Trans.Nucl.Sci.50,522.
  • 10Barnaby H J,2006.IEEE Trans.Nucl.Sci.53,3103.

共引文献40

同被引文献22

引证文献5

二级引证文献15

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部