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Electric admittance analysis of quartz crystal resonator in thickness-shear mode induced by array of surface viscoelastic micro-beams

Electric admittance analysis of quartz crystal resonator in thickness-shear mode induced by array of surface viscoelastic micro-beams
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摘要 The electric admittance of a compound system composed of a thickness-shear mode (TSM) quartz crystal resonator (QCR) and an array of surface viscoelastic micro-beams (MBs) is studied. The governing equations of the MBs are derived from the Timoshenko-beam theory in consideration of shear deformation. The electrical admittance is described directly in terms of the physical properties of the surface epoxy resin (SU-8) MBs from an electrically forced vibration analysis. It is found that both the inertia effect and the constraint effect of the MBs produce competitive influence on the resonant frequency and admittance of the compound QCR system. By further comparing the numerical results calculated from the Timoshenko-beam model with those from the Euler-beam model, the shear deformation is found to lead to some deviation of an admittance spectrum. The deviations are revealed to be evident around the admittance peak(s) and reach the maximum when a natural frequency of the MBs is identical to the fundamental frequency of the QCR. Besides, a higher order vibration mode of the MBs corresponds to a larger deviation at the resonance. The electric admittance of a compound system composed of a thickness-shear mode (TSM) quartz crystal resonator (QCR) and an array of surface viscoelastic micro-beams (MBs) is studied. The governing equations of the MBs are derived from the Timoshenko-beam theory in consideration of shear deformation. The electrical admittance is described directly in terms of the physical properties of the surface epoxy resin (SU-8) MBs from an electrically forced vibration analysis. It is found that both the inertia effect and the constraint effect of the MBs produce competitive influence on the resonant frequency and admittance of the compound QCR system. By further comparing the numerical results calculated from the Timoshenko-beam model with those from the Euler-beam model, the shear deformation is found to lead to some deviation of an admittance spectrum. The deviations are revealed to be evident around the admittance peak(s) and reach the maximum when a natural frequency of the MBs is identical to the fundamental frequency of the QCR. Besides, a higher order vibration mode of the MBs corresponds to a larger deviation at the resonance.
出处 《Applied Mathematics and Mechanics(English Edition)》 SCIE EI CSCD 2017年第1期29-38,共10页 应用数学和力学(英文版)
基金 Project supported by the National Natural Science Foundation of China(Nos.11272127 and51435006) the Research Fund for the Doctoral Program of Higher Education of China(No.20130142110022)
关键词 quartz crystal resonator (QCR) thickness-shear mode (TSM) electrical admittance shear deformation quartz crystal resonator (QCR), thickness-shear mode (TSM), electrical admittance, shear deformation
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