摘要
提出了ICP-AES法测定镀锡板表面钝化铬量检测方法。对样品溶解、校准曲线制备、设备参数等影响因素进行了研究,选择波长为205.560nm谱线为铬的分析线,铬的谱线强度与铬的含量呈线性关系,其线性回归方程y=0.00758x+0.00935。应用此法分析了镀锡板表面钝化铬量,相对标准偏差(n=11)在3.6%~9.3%之间。
The sample dissolution, calibration curve and instrument analysis parameters were studiedin detail,and a wavelength of 205. 560nm was selected as analytical line for Cr. Linear relationship between values of spectral line intensity of Cr and content of Cr was obtained as showed by the linear regression e- quation of y=0. 0436x＋0. 00574. The proposed method was applied to the analysis of tin plate samples, giving results of RSD＇s（n=ll） in the range of 3.6%-9.3%.
作者
周桂海
胡宏卫
Zhou Guihai Hu Hongwei(Technology center, Shanghai Meishan Iron and Steel Co. Ltd. , Nanjing 210039, China)
出处
《分析仪器》
CAS
2017年第1期34-36,共3页
Analytical Instrumentation
