摘要
为了解决目前片式元器件二次筛选过程中测试效率低、劳动强度大的问题,对元器件自动测试技术进行了研究,设计了片式元器件自动测试装置,该装置与现有的元器件测试设备相结合,构建了元器件自动测试系统,实现了片式元器件的半自动化测试;片式元器件样片的测试结果表明,该系统所得测试数据与现有方法的测试数据相一致,提高了测试效率。
In order to solve the problem of low efficiency and high labor intensity in the process of secondary screening of chip components, the automatic testing technology of components has been studied, The automatic testing device of chip components is designed. The device is combined with the existing components and test equipment to construct the automatic test system of components, which realizes the semi - automatic testing of chip components.The test results of the chip components show that the test data obtained by the system are consistent with the test data of the existing methods and improve the test efficiency.
出处
《数字技术与应用》
2017年第6期175-176,共2页
Digital Technology & Application
关键词
片式元器件
二次筛选
自动测试
chip components
secondary screening
automatic testing
