摘要
大气中子单粒子效应导致的集成电路软错误给应用于地面和大气层中的具有高可靠性要求的电子系统带来了严重的失效风险,因此有必要对集成电路的大气中子软错误率进行评估。重点研究了大气中子导致的集成电路软错误的错误率的加速测试技术。首先,分别基于JESD 89A标准和EXPACS仿真工具计算了地球大气层中不同海拔处的中子通量,结果表明大气中子辐射场受海拔高度的影响非常明显;然后,以一款存储器电路为例,探讨了基于单能中子/质子源和散裂中子源的大气中子软错误率加速测试方法;最后,分别利用这两种方法对该存储器电路在海平面和飞机飞行高度处的软错误率进行了计算,飞机飞行高度处更高的软错误率表明航空飞行器面临着更严重的可靠性风险。
The soft error of integrated circuits caused by atmospheric neutron effects brings failure risk to electronic systems with high reliability requirements used in the ground and in the atmosphere. Therefore, it is necessary to evaluate the atmospheric neutron soft error rate of integrated circuits. The accelerated test technique for soft error rate of integrated circuits caused by atmospheric neutron is mainly studied. Firstly, the neutron fluxes at different altitudes in the earth＇s atmosphere are calculated based on the JESD 89A standard and the EXPACS simulation tool. The results show that the atmospheric neutron radiation field is highly influenced by the altitude. Secondly, taking a storage circuit as an example, the accelerated test method for soft error rate of atmospheric neutron based on single energy neutron/proton source and spallation neutron source is discussed. Finally, the soft error rate of the storage circuit at sea level and flight altitude are calculated by using these two methods respectively. The higher soft error rate at flight altitude indicates that the aircraft is facing more serious reliability risk.
作者
彭超
PENG Chao(CEPREI, Guangzhou 510610, China Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, Guangzhou 510610, China)
出处
《电子产品可靠性与环境试验》
2017年第5期60-64,共5页
Electronic Product Reliability and Environmental Testing
关键词
地面宇宙射线
大气层中子
单粒子效应
软错误率
加速测试
terrestrial cosmic ray
atmospheric neutron
single event effect
soft error rate
accelerated test
