期刊文献+

基于COMSOL Multiphysics的硅通孔信号传输性能分析 被引量:2

Signal transmission performance analysis of TSV based on COMSOL Multiphysics
下载PDF
导出
摘要 通过分析信号-地TSV物理结构,提出可扩展等效电路模型,并用数学表达式表示出电容电感等电学参数。然后用多物理场耦合三维仿真软件COMSOL Multiphysics仿真信号-地TSV三维模型,并将COMSOL Multiphysics软件仿真分析得到的插入损耗结果和数学模型得到的结果作比较,验证建立的等效电路模型的准确性。最后,分析信号-地TSV半径、高度与间距对其插入损耗的影响。结果表明,信号-地TSV互连结构的传输性能随着半径的增大变得越好,随着其间距和高度的增加而变得越差。 By analyzing the physical structure of signal-ground TSV,a scalable equivalent circuit model is put forward,and its electrical parameters such as capacitance and inductance are shown with mathematical expressions. The multi-physics coupling three-dimensional simulation software COMSOL Multiphysics is used to simulate the three-dimensional model of signal-ground TSV. The insertion loss obtained with COMSOL Multiphysics simulation analysis is compared with that obtained with mathematical model to verify the accuracy of the established equivalent circuit model. The influence of the signal-ground TSV′s radius,height and spacing on the insertion loss is analyzed. The results show that the transmission performance of the signal-ground TSV interconnect structure becomes better with the increase of the radius,and worse with the increase of the height and spacing.
出处 《现代电子技术》 北大核心 2017年第23期34-37,共4页 Modern Electronics Technique
基金 湖北省公安厅自主科研项目(hbst2014yycx03)
关键词 信号-地硅通孔 等效电路模型 插入损耗 信号传输 signal-ground TSV equivalent circuit model insertion loss signal transmission
  • 相关文献

参考文献3

二级参考文献29

  • 1Xie Y, Chang Y W, Wang Y 2010 15th Asia and South Pacific Design Automation Conference ( ASP-DAC), Taiwan, Taibei, January 18-21,2010 p169.
  • 2Andry P S, Tsang C K, Webb B C, Sprogis E J, Wright S L, Bang B, Manzer D G 2008 IBM J. Resear, and Develop. 52 571.
  • 3LauJ H, Lim Y Y, Lim T G, Tang G Y, Khong C H 2008 Proceedings of SPIE- Photonics Packaging, Integration, and Interconnects VIII, San Jose, USA, January 19-24, 2008 DOI: 689907.
  • 4John H L, Tang G Y 2009 1EEE 59th Electronic Components and Technology Conference San Diego, CA, USA, May 26-29, 2009 p635.
  • 5张金松 吴懿平 王永国 陶媛.物理学报,59:4395-4395.
  • 6Shiv G S, Chuan S T 2009 IEEE International Conference on 3D System Integration, Washington, DC, USA, September 28-30, 2009 DOI:5306527.
  • 7Puttaswamy K, Lob G H 2006 Proceedings of the 16th ACM Great Lakes Symposium on VLSI, Washington, DC, USA, September 12-14, 2006 p19.
  • 8Cong J, Luo G J 2009 14th Asia and South Pacific Design Automation Conference ( ASP-DAC) , Yokohama, Japan, January 19-22, 2009 p361.
  • 9Yan H X, Zhou Q, Hong X L 2009 Integration, the VLSI Journal 42 175.
  • 10Jain A, Jones R E, Chatterjee R, Pozder S, Huang Z H 2008 11th lntersocicty Conference Thermal and Thermo-mechanical Phenomena in Electronics Systems (ITHERM), Orlando, Florida, USA, May 28-31 2008 p1139.

共引文献20

同被引文献21

引证文献2

二级引证文献9

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部