摘要
1概述 抖晃是衡量光盘读出信号质量的一项重要技术指 标,该参数的超标将导致光盘读取产生高错误率,甚至 出现不可纠正错误,使光盘上记录的数据失效。尤其当 光盘在高倍速下工作时,由于机械振动等因素的影响, 不仅会使光盘抖晃参数变坏,而且使精确检测抖晃参数 的难度大大增加,使高速光盘抖晃参数测试成为研究和 解决高速光盘质量和光盘驱动器设计制造中的重要技术 问题。
The jitter testing technology for high-speed optical disk was described in this paper. It is based on analysis of the jitter specification of high-speed optical disk. The principle of the system is the novel method of Two-Step Cascading Delay Line. The system was implemented using a single FPGA chip and VHDL programming language which has a character of high resolution, high reliability, compact architecture, simple operation and low cost. The testing results indicate that the system has internal jitter of 40 ps or lower with a single-shot resolution of 75ps and a multi-shot resolution of 5ps, and the system can be applied for jitter analysis of CD at a maximum speed of60X and DVD at 12X.
出处
《记录媒体技术》
2005年第1期28-32,共5页
China Mediatech
基金
本课题属于国家重点基础研究"973"项目G1999033003
