摘要
随着无损检测技术的发展，检测装置的技术含量和复杂程度日益提高，传感器阵列得到越来越广泛的应用，随之而来的虚警问题成为阻碍无损检测技术发展的一个重要问题．一方面，过高的虚警率（false alarm rate，FAR）会使人们对传感器阵列检测系统产生的数据结果失去信任，这就削弱了检测的意义．另一方面，只注重虚警率的影响，则可能造成漏检情况．因此，进行基于降虚警技术的传感器阵列优化研究迫在眉睫．旨在通过实验、仿真传感阵列布置问题的研究，达成优化虚警率的目的，并最终证明降虚警技术对于传感器阵列优化具有指导意义．
With the development of nondestructive testing technology, the complexity and technology content of detection devices are increasing. The sensor array has been widely used, and the ensuing false alarm problem becomes an important problem hindering the development of nondestructive testing technology. On the one hand, the high false alarm rate（FAR） will make people lose trust in the data generated by sensor array detection system, which weakens the significance of detection, on the contrary, only paying attention to the effect of false alarm rate may result in leakage. Therefore, it is urgent to optimize the sensor array based on False Alarm Reducing Technology. The purpose of this paper is to optimize the false alarm rate based on the research of the experimental study and simulation of sensor array placement problem. Finally, it is proved that the technology of reducing false alarm has important significance to the optimization of sensor array.
作者
张宇
ZHANG Yu(Institute of of Mechanical Engineering and Applied Electronics, Beijing University of Technology, Beijing 100124, China)
出处
《数学的实践与认识》
北大核心
2018年第7期317-320,共4页
Mathematics in Practice and Theory
基金
国家自然科学基金(50975006)
