摘要
电源管理集成电路（IC）的自动测试机（ATE）测试故障主要包括连续性失效、直流参数测试失效、交流参数测试失效和功能测试失效。ATE测试适用于大规模量产的不良产品的筛选,但是将ATE测试结果直接应用于失效分析依然存在覆盖局限性问题。针对不同功能测试结果,采用了不同的失效模式验证和分析方法。综合运用I-V曲线测试仪、示波器、函数发生器等仪器进行失效模式验证;使用微光显微镜、光诱导电阻变化仪器进行缺陷的失效定位;并借助电路原理图、版图进行故障假设;分析由过电应力、静电放电损伤、封装缺陷等导致的物理损伤;最终揭示了电源管理IC功能失效的主要原因。
The automatic test equipment（ ATE） test failure of power management integrated circuit（ IC） includes continuity test fail,DC parameter test fail,AC parameter test fail and the function test fail. The ATE test is mainly used for screening bad products of mass production. However,it is difficult for ATE to analyze the failure directly. Various failure modes verification and analysis methods were adopted for different function test results. First,I-V curve tracer,oscilloscope,function generator and other instruments were used to verify the failure mode. Then the emission microscope（ EMMI） and optical beam induced resistance change（ OBIRCH） were used to locate the failure. With the schematic circuit diagram and layout,a defect hypothesis was established. Furthermore,the physical damages caused by over electric stress,electrostatic discharge damage（ ESD） and the package failure were analyzed. Finally,the main reasons for the failure of power management IC were revealed.
作者
龚瑜
Gong Yu(Shenzhen STS Microelectronics Co. , Ltd. , Shenzhen 518048, China)
出处
《半导体技术》
CAS
CSCD
北大核心
2018年第5期394-400,共7页
Semiconductor Technology
