摘要
设计一种高精度的简易频率特性测试仪,该简易测试仪采用单片机STM32F104作为主控制器,控制DDS芯片AD9854产生扫频信号,采用AD8367设计扫频信号的增益自动控制电路,实现扫频频带内起伏不大于0.1dB,利用AD8302将幅度增益和相位转换成电压信号,利用单片机STM2F104内部集成AD完成各个频点的幅度增益和相位信号采集,并通过示波器显示屏显示幅频、相频特性曲线。搭建一阶、二阶RC无源滤波器和低频放大器作为测试用的二端电路网络,经实验测试结果分析表明,所设计系统能够精确完成二端电路网络0MHz至100MHz范围频率响应特性测试,分辨率高达4096个频点。
Designs a simple and high-precision frequency characteristic tester, the simple tester uses STM32F104 single-chip as the main controller to control the DDS chip AD9854 to generate the sweep signal. The AD8367 is used to design the gain automatic control circuit of the sweep signal, Band undulation is not more than 0.1 dB, the use of AD8302 amplitude gain and phase is converted to voltage signals, the use of single chip STM2F104 integrated AD to complete the amplitude and phase of each frequency gain signal acquisition, and through the oscilloscope display amplitude and phase frequency Characteristic curve. First-order, second-order RC passive filters and low-frequency amplifiers are used as the two-terminal circuit network for testing. The experimental results show that the designed system can accurately test the frequency response characteristics of 0 MHz to 100 MHz in two-rate up to 4096 frequency points.
作者
梁志勋
闭吕庆
LIANG Zhi-xun;BI Lv-qiang(Key Laboratory of Intelligent Computing and Pattern Recognition of Hechi Universiry,Yizhou 546300;School of Electronic and Comnmnication Engineering,Yulin Nomlal University,Yulin 537000)
出处
《现代计算机》
2018年第7期73-76,共4页
Modern Computer
基金
复杂系统优化与大数据处理广西高校重点实验室科研课题资助(No.2017CSOBDP0103)
