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波长复用傅里叶叠层显微术的关键参数研究

Research on the key parameters of wavelength multiplexed Fourier ptychographic microscopy
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摘要 波长复用傅里叶叠层显微术(WMFPM)是为了提高傅里叶叠层显微术的采集效率和进一步获取高分辨率彩色图像而提出的,但是目前选用实验系统器件参数时没有确定的方向。为了研究波长复用傅里叶叠层显微系统的关键参数对恢复彩色图像质量的影响,仿真实验分别研究了空间采样率、频谱重叠率以及二者结合对最终恢复质量的影响,结果表明:在相同的频谱重叠率下,空间采样率需要满足空域采样要求才能保证恢复质量,所以要选择满足空间采样要求的相机像素尺寸;在相同的空间采样率下,频谱重叠率在50%-70%之间,可以达到较好的恢复质量,因此需要根据实际的实验条件选择合适的LED和样品之间的距离。研究结果对设计系统和选用最佳的系统参数提供了一定的指导作用。 In order to enhance the efficiency of data acquisition of Fourier ptyc hographic microscopy as well as acquire a high-resolution color image,the wavele ngth multiplexed Fourier ptychographic microscopy (WMFPM) was proposed.However,there is no clear guideline when one choses the parameters of the experiment system.In order to investigate the impa ct of some key parameters of this technique on recovering quality,simulation experiments are c arried out to study the influence of spatial sampling ratio,spectral overlap ratio and the c ombination of the two on the quality of the final recovery.The research results show that spatial sampling ratio must satisfy the requirement of spatial sampling under the same s pectral overlap ratio.As a result,choosing the right size of the camera pixel to meet the spat ial sampling requirements is of vital importance.On the other hand,under the same spatial sampling ratio,the spectral overlap ratio range of 50%-70% is the best to recov er a high-resolution color image.Therefore,the appropriate distance between the LED and the sample should be selected according to the actual experimental conditions.The research results provide a certain guiding role for the design of system and the selection of the optimal system parameters .
作者 唐立金 张慕阳 侯方 梁艳梅 TANG Li-jin;ZHANG Mu-yang;HOU Fang;LIANG Yan-mei(Institute of Modern Optics,College of Electronic Information and Optical Engineering, Nankai University, Tianjin 300350, Chin)
出处 《光电子.激光》 EI CAS CSCD 北大核心 2018年第7期778-786,共9页 Journal of Optoelectronics·Laser
基金 国家自然科学基金(11374167) 天津市科技支撑重点项目(17YFZCSY00740)资助项目
关键词 傅里叶叠层显微术 波长复用 空间采样率 频谱重叠率 Fourier ptychographic microscopy (FPM) wavelength multiplex spatial sampling ratio spectral overlap ratio
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