摘要
对比了三组不同试验项目顺序的流程下多层瓷介电容器(MLCC)的失效率情况,并对试验中出现的不合格品进行破坏性物理分析(DPA),以研究试验流程对MLCC质量可靠性的影响。结果表明,当流程中的试验项目顺序不同时,MLCC失效率从1‰变为3‰,说明不同的试验流程对MLCC的质量可靠性影响较大,其中将温度冲击和超声波无损检测分别置于试验流程的首位、末位时可更有效地识别和剔除早期失效品。
Failure rate of multi-layer ceramic capacitor(MLCC)in three different testing procedures were compared,and destructive physical analysis(DPA)of unqualified products was made.Based on that,the effect of testing procedure on the reliability of MLCC was investigated.The experimental results show that when the order of test items in the procedure is different,the failure rate of MLCC changes from 1‰to 3‰.It indicates that testing procedure can affect the reliability of MLCC.When the temperature shock and ultrasonic nondestructive test are placed at the first and last position of the testing procedure respectively,early failure products can be identified and eliminated more effectively.
作者
卫冬娟
秦英德
张玲
赵碧全
吴晓东
WEI Dongjuan;QIN Yingde;ZHANG Ling;ZHAO Biquan;WU Xiaodong(Chengdu Hongming & UESTC New Materials Co.,Ltd,Chengdu 610100,China)
出处
《电子元件与材料》
CAS
CSCD
北大核心
2019年第2期98-102,共5页
Electronic Components And Materials
