摘要
材料结构的变化与所含杂质对导热系数都有明显的影响,因此材料的导热系数常通过稳态法由实验具体测定。通过分析现有物理实验仪器的不足,提出了一种以STM32单片机为主控芯片,DS18B20温度传感器进行温度采集的改进方法,制作出能同时实现温度测量、数据采集、加热控制、实验计时、曲线绘制、串口通信等功能的不良导体导热系数实验仪。实验表明,改进后的仪器测量过程稳定,数据精度高且操作极其便捷,对于不良导体导热系数测量实验具有一定的应用价值。
The material structure and enclosed impurities have obvious influence on thermal conductivity, so the thermal conductivity of material is often measured by the steady state method. In this paper, an im proved method is introduced. Temperature data are collected and obtained using DS18B20 temperature sensor which is controlled by the STM32 microcontroller. The temperature measurement, data collection, heating control, experiment timing, curve drawing, and serial communication can be simultaneously achieved by the improved thermal conductivity experimental instrument for poor conductor. The results show that the improved instrument has a stable measuring process, high data accuracy and convenient op eration ,which has great application value for the thermal conductivity measurement experiment on poor conductors.
作者
林杉
修俊山
李季远
LIN Shan;XIU Junshan;LI Jiyuan(School of Physics and Optoelectronic Engineering, Shandong University of Technology, Zibo 255049, China)
出处
《山东理工大学学报（自然科学版）》
CAS
2019年第6期20-24,共5页
Journal of Shandong University of Technology:Natural Science Edition
基金
国家自然科学基金项目(11704228)
山东省自然科学基金项目(ZR2016AQ22)
关键词
稳态法
导热系数
温度传感器
单片机
steady-state method
thermal conductivity
temperature sensor
microcontrollers
