摘要
A new method for micro-beam XRF localiztion is presented.A laser beam along with an incident X-ray hits on the surface of a sample.The micro region on the sample that reached by X-ray beam can be localized by means of the visible spot of the laser beam.This method is suitable for X-ray microprobes using an X-ray tube or synchrotron radiation as excitation sources.
A new method for micro-beam XRF localization is presented. A laser beam along with an incident X-ray hits on the surface of a sample. The micro region on the sample that reached by X-ray beam can be localized by means of the visible spot of the laser beam. This method is suitable for X-ray microprobes using an X-ray tube or synchrotron radiation as excitation sources.
关键词
激光束
λ射线束
化合物分析
Localization for X-ray micro-beam, Laser beam
