摘要
针对电子设备的振动疲劳特性,提出了基于频率分析法的随电子荷分析过程。首先对电子设备结构进行频率动态响应特性计算,再结合Steinberg提出的三区间法,建立电子设备的疲劳损伤模型,应用有限元法对电子设备中的易损件进行疲劳寿命仿真分析,计算得到电子设备易损件的累积损伤值。研究结果对电子设备的设计研发具有一定的借鉴和指导意义。
Aiming at the vibration fatigue characteristics of electronic equipments,a random load process based on frequency analysis method is proposed.At first,the frequency dynamic response characteristics of the structure are calculated.And then,the fatigue damage model of the electronic equipment is established combining with the three interval method proposed by Steinberg.The fatigue life of the vulnerable parts of the electronic equipment is simulated and analyzed by using the finite element method,and the cumulative damage value of the vulnerable parts of the electronic equipment is calculated.The research results have certain reference and guiding significance for the design and development of electronic equipments.
作者
马国茂
刘烨磊
MA Guo-mao;LIU Ye-lei(Academy of Opto-Electronic,China Electronic Technology Group Corporation(AOE CETC),Tianjin,China)
出处
《光电技术应用》
2021年第3期81-84,共4页
Electro-Optic Technology Application
关键词
振动疲劳
频率分析法
随电子荷
疲劳寿命
vibration fatigue
frequency analysis method
random load
fatigue life
