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Ambipolar device simulation based on the drift-diffusion model in ion-gated transition metal dichalcogenide transistors 被引量:1

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摘要 Ionic gating is known as a powerful tool for investigation of electronic functionalities stemming from low voltage transistor operation to gate-induced electronic phase control including superconductivity.Two-dimensional(2D)material is one of the archetypal channel materials which exhibit a variety of gate-induced phenomena.Nevertheless,the device simulations on such iongated transistor devices have never been reported,despite its importance for the future design of device structures.In this paper,we developed a drift-diffusion(DD)model on a 2D material,WSe2 monolayer,attached with an ionic liquid,and succeeded in simulating the transport properties,potential profile,carrier density distributions in the transistor configuration.
出处 《npj Computational Materials》 SCIE EI CSCD 2020年第1期1446-1454,共9页 计算材料学(英文)
基金 This research was supported by Grant-in-Aid for Scientific Research(S)(no.19H05602) Grant-in-Aid for Scientific Research(C)(no.19K05201)from JSPS.
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