摘要
对液晶屏表面进行缺陷检测时,其表面纵横分布的纹理会对检测精度造成干扰。提出了一种液晶屏缺陷检测方法,首先采用基于相对总变差模型的图像结构提取方法抑制液晶屏纹理,该模型对非统一或各向异性的纹理均适用,能有效分解液晶图像中的结构信息和纹理。提取后的结构信息采用High-boost滤波器增强高频分量同时保持低频分量的特性,对图像中的缺陷进行显著性检测。实验结果表明该方法确实有效地抑制了背景纹理信息,同时完整地保留了缺陷信息,实现了液晶屏缺陷的显著性检测并提高了液晶图像的缺陷检测准确性。
When defect detection is carried out on the surface of liquid crystal screen, the horizontal and horizontal texture of the surface will interfere with the detection accuracy. A defect detection method for liquid crystal screen is proposed. Firstly, the texture of liquid crystal screen is suppressed by the image structure extraction method based on the relative total variation model. This model is applicable to both non-uniform and anisotropic textures, and can effectively decompose the structural information and texture in liquid crystal image. The extracted structural information is enhanced by High-boost filter while keeping the characteristics of low-frequency component, and the saliency detection of defects in the image is carried out. The experimental results show that this method can effectively suppress the background texture information and retain the defect information completely, which can realize the saliency detection of LCD screen defects and improve the accuracy of LCD image defect detection.
作者
汪永勇
侯俊
李梦思
薛彤
肖雄
Wang Yongyong;Hou Jun;Li Mengsi;Xue Tong;Xiao Xiong(School of Optical-Electrical and Computer Engineering,University of Shanghai for Science and Technology,Shanghai 200093,China)
出处
《电子测量技术》
北大核心
2021年第12期93-96,共4页
Electronic Measurement Technology
