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大口径光电设备温度补偿模型研究 被引量:1

Temperature Compensation Model for Large-Aperture Optoelectronic Devices
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摘要 大口径光电设备作为多领域探测的主要工具,具有探测能力强、细节分辨清晰等特点。但受光学原理的限制,大口径光电设备对高精度调焦的依赖度较高,而温度是造成图像质量降低的重要因素之一。为补偿温度对大口径光电设备的影响,分析了系统等效焦距与温度之间的理论关系,仿真分析了传统温度补偿模型的局限性。为实现温度与焦距的精确建模,引入一阶傅里叶函数模型,实现了温度与焦距之间的精确拟合。最后通过对比传统线性模型与一阶傅里叶函数模型在工程中的适用情况,表明一阶傅里叶函数补偿模型的准确性远高于线性补偿模型。同时所提模型关系简单,实现容易,可在大口径光电设备设计、检测中使用,也可用于温度调焦。 As the main detection tool in multi-field,large-aperture optoelectronic devices are characterized by strong detection capability and high resolution.However,limited by the optical principle,such devices show a strong dependence on precise focusing.Temperature focusing is a key operation for maintaining image quality.First,this study analyzes the theoretical relation between the temperature and the equivalent focal length of the system.Then,the shortcomings of the traditional compensation model are obtained via simulations.To accurately model the relation between the temperature and the focal length,the first-order Fourier function model is introduced for compensating the change in the focal length owing to the temperature.Finally,the linear compensation model and the first-order Fourier function model are compared based on application data.Results show that the fitting accuracy of temperature and focal length for first-order Fourier function model is higher than that for the linear compensation model.The first-order Fourier function model is simple and easy to implement.Moreover,it can be used for test and design of large-aperture optoelectronic devices and for temperature focusing.
作者 梁倩 张涯辉 Liang Qian;Zhang Yahui(Key Laboratory of Beam Control,Chinese Academy of Sciences,Chengdu,Sichuan 610209,China;Institute of Optics and Electronics,Chinese Academy of Sciences,Chengdu Sichuan610209,China;University of Chinese Academy of Sciences,Beijing 100049,China)
出处 《激光与光电子学进展》 CSCD 北大核心 2021年第19期183-188,共6页 Laser & Optoelectronics Progress
关键词 测量 温度补偿 线性模型 傅里叶函数模型 误差分析 measurement temperature compensation linear model Fourier function model error analysis
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