摘要
"新工科"背景下高等院校迫切需要创新教学方法,结合科研课题进行案例教学是一个有效举措。针对数字电路学科中的一类前沿问题"数字电路老化"展开了深入研究。随着芯片制造工艺的不断改进,电路的老化效应面临着新的情况与挑战。负偏置温度不稳定性(NBTI)是影响电路老化的主要因素,针对这一课题结合静态时序分析来精准地预测电路老化延时情况。通过汇聚不同学科的知识点来有效解决问题,深化了同学们的认识,提升了他们的学习兴趣,取得了很好的教学示范效果。
Under the background of new engineering,the teaching method should be innovated in colleges and universities.It is an effective measure to carry out case teaching basing on scientific research topics.Aiming at the forward issues of digital circuit aging,an in-depth research has been carried out.With the continuous improvement of process technology,the aging effect of circuit is becoming situations challenging.This research is based on Negative Bias Temperature Instability(NBTI),which is the main factor affecting circuit aging,combined with the static timing analysis to accurate delay prediction of circuit.By converging knowledge points of different subjects to solve problems effectively,the study capabilities were improved,their interest in learning has been enhanced,where a wonderful demonstration has been achieved.
作者
徐辉
XU Hui(School of Computer Science and Engineering,Anhui University of Science and Technology,Huainan 232001,China)
出处
《安庆师范大学学报（自然科学版）》
2021年第4期112-117,共6页
Journal of Anqing Normal University(Natural Science Edition)
基金
国家自然科学基金(61874156,61404001)
安徽省高等学校省级质量工程项目(2015MOOC047)
中国高等教育学会高等教育科学研究“十三五”规划课题(16YB061)
安徽省教育厅教学示范课项目(皖教秘高[2020]165号)
安徽理工大学一流本科课程项目。
关键词
数字电路课程
案例教学
老化
digital circuit course
case teaching
aging
