摘要
在SWa P^(3)(Size,Weight,and Power,Performance and Price)概念的驱使下,第三代制冷红外探测器向着高性能、小型化和轻量化的方向发展。作为军用核心电子元器件,制冷红外探测器的可靠性成为研究的重点。以浙江珏芯微电子有限公司所研制的640×512/15μm小型化杜瓦组件为研究对象,开展了系统性的可靠性研究与试验,涉及到力学、热力学、多余物和真空寿命四个维度。经各项可靠性试验后,640×512/15μm小型化杜瓦组件的性能保持良好,该结果表明此杜瓦组件在总体上具有较高的可靠性,能够满足常规军事应用需求。
Driven by the concept of SWa P^(3)(Size,Weight,and Power,Performance and Price),the development of the third-generation cooled IR detectors is proceeding in the direction of high performance,miniaturization,and light weight.As core military electronic devices,the reliability of IR detectors has become the focus of research.In this study,based on the 640×512/15μm miniaturized dewar developed by Zhejiang Juexin Microelectronics Co.,Ltd.,a systematic reliability research is carried out.This research involves four dimensions,namely mechanics,thermodynamics,remainders,and vacuum.The performance of the640×512/15μm miniaturized dewar is evaluated through reliability tests.The results show that the miniaturized dewar has high reliability to satisfy most military needs.
作者
熊雄
段煜
胡明灯
李锐平
杜宇
毛剑宏
XIONG Xiong;DUAN Yu;HU Mingdeng;LI Ruiping;DU Yu;MAO Jianhong(Zhejiang Juexin Microelectronics Co.,Ltd.,Lishui 323000,China)
出处
《红外技术》
CSCD
北大核心
2022年第1期89-95,共7页
Infrared Technology
关键词
红外探测器
杜瓦组件
小型化
可靠性
infrared detector
dewar assembly
miniaturize
reliability
